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TITLE:
Compact Modelling of Quantum Confinement in III-V Gate All Around Nanowire MOSFET - imarina:5873955

URV's Author/s:Iñiguez Nicolau, Benjamin
Author, as appears in the article.:Abdelmoneam A; Iñiguez B; Fedawy M
Author's mail:benjamin.iniguez@urv.cat
Author identifier:0000-0002-6504-7980
Journal publication year:2018
Publication Type:Proceedings Paper
APA:Abdelmoneam A; Iñiguez B; Fedawy M (2018). Compact Modelling of Quantum Confinement in III-V Gate All Around Nanowire MOSFET.
Papper original source:Proceedings Of The 2018 12th Spanish Conference On Electron Devices, Cde 2018.
Abstract:© 2018 IEEE. In this paper, a compact equation for calculating energy sub-bands inside III-V gate all around nanowire MOSFET is developed taking into consideration the penetration of the wave function into the gate oxide and the effective mass discontinuity at the semiconductor-oxide interface. The values of the sub-band energies result from solving Schrodinger's equation in cylindrical coordinates is expressed in Bessel functions. We use an approximation for Bessel functions with the introduction of one fitting parameter. Additionally, a compact equation is developed for the potential due to charge associated with the first sub-band inside the semiconductor. The results show very good agreement with self-consistent Schrodinger-Poisson solver data.
Article's DOI:10.1109/CDE.2018.8597131
Link to the original source:https://ietresearch.onlinelibrary.wiley.com/doi/10.1049/el.2018.5075
Papper version:info:eu-repo/semantics/publishedVersion
licence for use:https://creativecommons.org/licenses/by/3.0/es/
Department:Enginyeria Electrònica, Elèctrica i Automàtica
Licence document URL:https://repositori.urv.cat/ca/proteccio-de-dades/
Keywords:Nanowire mosfets
Iii-v semiconductor
Compact modeling
Entity:Universitat Rovira i Virgili
Record's date:2023-02-18
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