Repositori institucional URV
| URV's Author/s: | Iñiguez Nicolau, Benjamin |
| Author, as appears in the article.: | Nikolaou A; Leise J; Pruefer J; Zschieschang U; Klauk H; Darbandy G; Iniguez B; Kloes A |
| Author's mail: | benjamin.iniguez@urv.cat |
| Author identifier: | 0000-0002-6504-7980 |
| Journal publication year: | 2021 |
| Publication Type: | Journal Publications |
| ISSN: | 0018-9383 |
| e-ISSN: | 1557-9646 |
| APA: | Nikolaou A; Leise J; Pruefer J; Zschieschang U; Klauk H; Darbandy G; Iniguez B; Kloes A (2021). Noise-Based Simulation Technique for Circuit-Variability Analysis. Ieee Journal Of The Electron Devices Society, 9(), 450-455. DOI: 10.1109/JEDS.2020.3046301 |
| Papper original source: | Ieee Journal Of The Electron Devices Society. 9 450-455 |
| Abstract: | CCBY An accurate and efficient noise-based simulation technique for predicting the impact of device-parameter variability on the DC statistical behavior of integrated circuits is presented. The proposed method is validated on a source follower, a diode-load inverter and a current mirror based on organic thin-film transistors. Taking advantage of the standard noise analysis of a circuit, after translating the statistical variation of the electrical parameters of the transistors into equivalent-noise circuit components, the proposed technique yields results identical to those obtained from a Monte Carlo simulation, but in a significantly shorter amount of time. |
| Article's DOI: | 10.1109/JEDS.2020.3046301 |
| Link to the original source: | https://ieeexplore.ieee.org/document/9302569 |
| Papper version: | info:eu-repo/semantics/publishedVersion |
| licence for use: | https://creativecommons.org/licenses/by/3.0/es/ |
| Department: | Enginyeria Electrònica, Elèctrica i Automàtica |
| Licence document URL: | https://repositori.urv.cat/ca/proteccio-de-dades/ |
| Thematic Areas: | Engineering, electrical & electronic Electronic, optical and magnetic materials Electrical and electronic engineering Biotechnology |
| Keywords: | Verilog-a Variability Transistors Threshold voltage Thin-film transistors Thin-film transistor Thin film transistors Organic circuits. Organic circuits Noise Monte carlo methods Monte carlo analysis Model Logic gates Integrated circuit modeling Hardware design languages Compact modeling |
| Entity: | Universitat Rovira i Virgili |
| Record's date: | 2024-07-27 |
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