Author, as appears in the article.: Zhang, Guidong; Chen, Weichen; Yu, Samson S; El Aroudi, Abdelali
Department: Enginyeria Electrònica, Elèctrica i Automàtica
e-ISSN: 1097-007X
URV's Author/s: El Aroudi Chaoui, Abdelali
Keywords: Nonelectrolytic capacitors Low capacitor voltage stresses Hourglass impedance network High step-up converters
Abstract: © 2020 John Wiley & Sons, Ltd. In this study, a novel high-step-up converter is proposed with a new hourglass-shaped impedance network (HIN). Due to the short lifetime of electrolytic capacitors (ECs), the proposed converter uses nonelectrolytic capacitors (NECs), which however can realize all ECs' features. Besides, the proposed converter has low capacitor voltage stresses, ensuring it could be electrolytic-capacitors-free. With this feature, the proposed high step-up converter has smaller size, lighter weight, smaller parasitic resistance, and longer operation life than the conventional ones with ECs. In this paper, detailed operational principle and performance of the proposed converter are presented, to demonstrate its advanced features. Simulation and experimental studies are also carried out, which validate the feasibility and effectiveness of the proposed converter.
Thematic Areas: Engineering, electrical & electronic Engenharias iv Electronic, optical and magnetic materials Electrical and electronic engineering Computer science applications Astronomia / física Applied mathematics
licence for use: https://creativecommons.org/licenses/by/3.0/es/
ISSN: 0098-9886
Author's mail: abdelali.elaroudi@urv.cat
Author identifier: 0000-0001-9103-7762
Record's date: 2024-10-12
Papper version: info:eu-repo/semantics/publishedVersion
Licence document URL: https://repositori.urv.cat/ca/proteccio-de-dades/
Papper original source: International Journal Of Circuit Theory And Applications. (4): 1147-1163
APA: Zhang, Guidong; Chen, Weichen; Yu, Samson S; El Aroudi, Abdelali (2021). Hourglass-shaped impedance network based nonelectrolytic capacitors high step-up converter with low voltage stress. International Journal Of Circuit Theory And Applications, (4), 1147-1163. DOI: 10.1002/cta.2904
Entity: Universitat Rovira i Virgili
Journal publication year: 2021
Publication Type: Journal Publications