Autor segons l'article: Almora, Osbel; Lopez-Varo, Pilar; Escalante, Renan; Mohanraj, John; Marsal, Lluis F; Olthof, Selina; Anta, Juan A
Departament: Enginyeria Electrònica, Elèctrica i Automàtica
Autor/s de la URV: Almora Rodríguez, Osbel / Marsal Garví, Luis Francisco
Paraules clau: Stability Silico Recombination Efficiency Degradation Charge collection
Resum: Perovskite solar cells (PSCs) continue to be the "front runner" technology among emerging photovoltaic devices in terms of power conversion efficiency and versatility of applications. However, improving stability and understanding their relationship with their ionic-electronic transport mechanisms continue to be challenging. In this work, a case study of NiOx-based inverted PSCs and the effect of different interface passivating treatments on device performance is presented. Impedance spectroscopy (IS) measurements in short-circuit conditions were performed under different illumination intensities, as well as bias-stress operational stability tests under constant illumination intensity. Surface treatments that involved bulky Lewis bases resulted in better and more stable performance. In contrast, acidic anion donors could induce both an initial performance decrease with a characteristic three-arcs impedance Nyquist plot and a subsequent instability during light exposure. Drift-diffusion simulations suggest strong modifications of surface recombination at the interface with the hole transport material, and for the ion concentration and mobilities in the perovskite. Importantly, capacitance and resistance are shown to peak maximum and minimum values, respectively, around mobile ion concentration (N-ion) of 10(16) and 10(17) cm(-3). These features relate to the transition from a drift-, for low N-ion below a threshold value, to a diffusion-dominated transport in the bulk of the perovskite, for high N-ion beyond the threshold value. Our results introduce a general route for characterization of instability paths in PSCs via IS performed under short-circuit conditions.
Àrees temàtiques: Química Physics, applied Physics and astronomy (miscellaneous) Physics and astronomy (all) Odontología Medicina iii Medicina ii Medicina i Materiais Matemática / probabilidade e estatística Interdisciplinar Geociências General physics and astronomy Farmacia Ensino Engenharias iv Engenharias iii Engenharias ii Engenharias i Condensed matter physics Ciências biológicas iii Ciências biológicas i Ciências ambientais Ciências agrárias i Ciência da computação Biotecnología Biodiversidade Atomic and molecular physics, and optics Astronomia / física Antropologia / arqueologia
Accès a la llicència d'ús: https://creativecommons.org/licenses/by/3.0/es/
Adreça de correu electrònic de l'autor: osbel.almora@urv.cat lluis.marsal@urv.cat
Identificador de l'autor: 0000-0002-2523-0203 0000-0002-5976-1408
Data d'alta del registre: 2024-09-28
Versió de l'article dipositat: info:eu-repo/semantics/publishedVersion
Enllaç font original: https://pubs.aip.org/aip/jap/article/136/9/094502/3311153/Instability-analysis-of-perovskite-solar-cells-via
Referència a l'article segons font original: Journal Of Applied Physics. 136 (9): 094502-
Referència de l'ítem segons les normes APA: Almora, Osbel; Lopez-Varo, Pilar; Escalante, Renan; Mohanraj, John; Marsal, Lluis F; Olthof, Selina; Anta, Juan A (2024). Instability analysis of perovskite solar cells via short-circuit impedance spectroscopy: A case study on NiOx passivation. Journal Of Applied Physics, 136(9), 094502-. DOI: 10.1063/5.0216983
URL Document de llicència: https://repositori.urv.cat/ca/proteccio-de-dades/
DOI de l'article: 10.1063/5.0216983
Entitat: Universitat Rovira i Virgili
Any de publicació de la revista: 2024
Tipus de publicació: Journal Publications