Articles producció científicaEnginyeria Electrònica, Elèctrica i Automàtica

THM-OTFT: A Complete Physics-Based Verilog-A Compact Model for Short-Channel Organic Thin-Film Transistors

  • Datos identificativos

    Identificador:  imarina:9441806
    Autores:  Kloes, Alexander; Leise, Jakob; Pruefer, Jakob; Nikolaou, Aristeidis; Iniguez, Benjamin; Gneiting, Thomas; Klauk, Hagen; Darbandy, Ghader
    Resumen:
    This paper presents a compact model for organic thin-film transistors fabricated in the staggered or coplanar device architecture which includes short-channel effects related to the potential barrier in the channel region, which manifest themselves as threshold voltage roll-off, drain-induced barrier lowering, and subthreshold swing degradation. Furthermore, the effect of non-linear injection due to a work-function mismatch between the source/drain contacts and the semiconductor is considered. The model includes a charge-based capacitance model considering overlap and fringing regions in short-channel multi-finger layout structures. Extensions include a model for drain-current variability, low-frequency noise and non-quasistatic effects. The introduction of physically meaningful fitting parameters provides a high degree of flexibility to the model. The equation package is verified using the results of measurements performed on transistors fabricated on flexible substrates and is available in Verilog-A for an efficient circuit simulation on different design platforms.
  • Otros:

    Enlace a la fuente original: https://ieeexplore.ieee.org/document/10179906
    Referencia de l'ítem segons les normes APA: Kloes, Alexander; Leise, Jakob; Pruefer, Jakob; Nikolaou, Aristeidis; Iniguez, Benjamin; Gneiting, Thomas; Klauk, Hagen; Darbandy, Ghader (2023). THM-OTFT: A Complete Physics-Based Verilog-A Compact Model for Short-Channel Organic Thin-Film Transistors. Ieee Journal Of The Electron Devices Society, 11(), 734-743. DOI: 10.1109/JEDS.2023.3294598
    Referencia al articulo segun fuente origial: Ieee Journal Of The Electron Devices Society. 11 734-743
    DOI del artículo: 10.1109/JEDS.2023.3294598
    Año de publicación de la revista: 2023
    Entidad: Universitat Rovira i Virgili
    Versión del articulo depositado: info:eu-repo/semantics/publishedVersion
    Fecha de alta del registro: 2025-02-18
    Autor/es de la URV: Iñiguez Nicolau, Benjamin
    Departamento: Enginyeria Electrònica, Elèctrica i Automàtica
    URL Documento de licencia: https://repositori.urv.cat/ca/proteccio-de-dades/
    Tipo de publicación: Journal Publications
    Autor según el artículo: Kloes, Alexander; Leise, Jakob; Pruefer, Jakob; Nikolaou, Aristeidis; Iniguez, Benjamin; Gneiting, Thomas; Klauk, Hagen; Darbandy, Ghader
    Acceso a la licencia de uso: https://creativecommons.org/licenses/by/3.0/es/
    Áreas temáticas: Biotechnology, Electrical and electronic engineering, Electronic, optical and magnetic materials, Engineering, electrical & electronic
    Direcció de correo del autor: benjamin.iniguez@urv.cat
  • Palabras clave:

    Adaptation models
    Capacitance
    Compact model
    Device modeling
    Integrated circuit modeling
    Logic gates
    Mathematical models
    Nois
    Noise
    Organic semiconductor
    Organic thin film transistors
    Semiconductor device modeling
    Short channel
    Thin-film transistor
    Transistors
    Variability
    Biotechnology
    Electrical and Electronic Engineering
    Electronic
    Optical and Magnetic Materials
    Engineering
    Electrical & Electronic
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