Articles producció científicaEnginyeria Electrònica, Elèctrica i Automàtica

THM-OTFT: A Complete Physics-Based Verilog-A Compact Model for Short-Channel Organic Thin-Film Transistors

  • Datos identificativos

    Identificador:  imarina:9441806
    Autores:  Kloes, A; Leise, J; Pruefer, J; Nikolaou, A; Iñíguez, B; Gneiting, T; Klauk, H; Darbandy, G
    Resumen:
    This paper presents a compact model for organic thin-film transistors fabricated in the staggered or coplanar device architecture which includes short-channel effects related to the potential barrier in the channel region, which manifest themselves as threshold voltage roll-off, drain-induced barrier lowering, and subthreshold swing degradation. Furthermore, the effect of non-linear injection due to a work-function mismatch between the source/drain contacts and the semiconductor is considered. The model includes a charge-based capacitance model considering overlap and fringing regions in short-channel multi-finger layout structures. Extensions include a model for drain-current variability, low-frequency noise and non-quasistatic effects. The introduction of physically meaningful fitting parameters provides a high degree of flexibility to the model. The equation package is verified using the results of measurements performed on transistors fabricated on flexible substrates and is available in Verilog-A for an efficient circuit simulation on different design platforms.
  • Otros:

    Enlace a la fuente original: https://ieeexplore.ieee.org/document/10179906
    Referencia de l'ítem segons les normes APA: Kloes, A; Leise, J; Pruefer, J; Nikolaou, A; Iñíguez, B; Gneiting, T; Klauk, H; Darbandy, G (2023). THM-OTFT: A Complete Physics-Based Verilog-A Compact Model for Short-Channel Organic Thin-Film Transistors. Ieee Journal Of The Electron Devices Society, 11(), 734-743. DOI: 10.1109/JEDS.2023.3294598
    Referencia al articulo segun fuente origial: Ieee Journal Of The Electron Devices Society. 11 734-743
    DOI del artículo: 10.1109/JEDS.2023.3294598
    Año de publicación de la revista: 2023-01-01
    Entidad: Universitat Rovira i Virgili
    Versión del articulo depositado: info:eu-repo/semantics/publishedVersion
    Fecha de alta del registro: 2026-05-09
    Autor/es de la URV: Iñiguez Nicolau, Benjamin
    Departamento: Enginyeria Electrònica, Elèctrica i Automàtica
    URL Documento de licencia: https://repositori.urv.cat/ca/proteccio-de-dades/
    Tipo de publicación: Journal Publications
    Autor según el artículo: Kloes, A; Leise, J; Pruefer, J; Nikolaou, A; Iñíguez, B; Gneiting, T; Klauk, H; Darbandy, G
    Acceso a la licencia de uso: https://creativecommons.org/licenses/by/3.0/es/
    Áreas temáticas: Engineering, electrical & electronic, Electronic, optical and magnetic materials, Electrical and electronic engineering, Ciências agrárias i, Biotechnology
    Direcció de correo del autor: benjamin.iniguez@urv.cat, benjamin.iniguez@urv.cat
  • Palabras clave:

    Variability
    Transistors
    Thin-film transistor
    Short channel
    Semiconductor device modeling
    Organic thin film transistors
    Organic semiconductor
    Noise
    Nois
    Mathematical models
    Logic gates
    Integrated circuit modeling
    Device modeling
    Compact model
    Capacitance
    Adaptation models
    Biotechnology
    Electrical and Electronic Engineering
    Electronic
    Optical and Magnetic Materials
    Engineering
    Electrical & Electronic
    Ciências agrárias i
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