Charge-Based Compact Modeling of Capacitances and Low-Frequency Noise in Organic Thin-Film Transistors

Identifier:  TDX:3849

Handle: https://hdl.handle.net/20.500.11797/TDX3849

Authors:  Leise, Jakob Simon

Abstract:
Organic thin-film transistors are promising candidates for novel electronics applications due to the possibility of fabricating organic electronic devices at low temperatures on flexible substrates like plastic or paper. This doctoral thesis deals with the development of a charge-based compact model for the description of the capacitive behavior and the low-frequency noise in organic thin-film transistors. Based on an existing DC model, expressions for the total charges under quasistatic operation conditions are derived. Non-quasistatic effects are captured by different methods, such as the channel-segmentation approach or frequency-dependent scaling functions of the areas in the transistor where charges are calculated. The model for the total charges is verified by capacitance measurements of a staggered organic TFT and by numerical simulations of organic TFTs in the staggered and coplanar architectures using the device simulator Sentaurus TCAD. The non-quasistatic models are verified by frequency-dependent admittance measurements of a staggered transistor and by scattering-parameter measurements of coplanar and staggered transistors. The compact model is implemented in the hardware description language Verilog-A and the simulation of a differential amplifier is compared to measurements, which shows a good agreement. The noise model is verified by measurements of staggered organic TFTs and by TCAD simulations. The compact model shows an overall good agreement and flexibility with respect to the device architecture (e. g. staggered or coplanar) and the used materials.