Tesis doctorals> Departament d'Enginyeria Electrònica, Elèctrica i Automàtica

Study of Structural and Sensing Properties of Tungsten Trioxide Thin Films Deposited By RF Sputtering

  • Datos identificativos

    Identificador: TDX:1912
    Handle: https://hdl.handle.net/20.500.11797/TDX1912
    Autores:
    Vallejos Vargas, Stella

  • Otros:

    Fecha: 2008-02-29
    Departamento/Instituto: Departament d'Enginyeria Electrònica, Elèctrica i Automàtica Universitat Rovira i Virgili.
    Idioma: eng
    Identificador: http://hdl.handle.net/10803/8461 http://www.tdx.cat/TDX-0702108-134223 9788469197486 T-1249-2008
    Fuente: TDX (Tesis Doctorals en Xarxa)
    Autor: Vallejos Vargas, Stella
    Director: Viacheslav Khatko
    Formato: application/pdf
    Editor: Universitat Rovira i Virgili
    Palabra clave: study of structural ans sensing properties of tungsten trioxide thin films deposited by rf suuttering method
    Título: Study of Structural and Sensing Properties of Tungsten Trioxide Thin Films Deposited By RF Sputtering
    Materia: 621.3 study of structural ans sensing properties of tungsten trioxide thin films deposited by rf suuttering method

  • Palabras clave:

    621.3
    study of structural ans
    sensing properties of tungsten trioxide
    thin films deposited by
    rf suuttering method

  • Documentos:

    Memoria

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