Articles producció científicaEnginyeria Electrònica, Elèctrica i Automàtica

The Schottky barrier transistor in emerging electronic devices

  • Dades identificatives

    Identificador:  imarina:9296513
    Autors:  Schwarz, M; Vethaak, TD; Derycke, V; Francheteau, A; Iniguez, B; Kataria, S; Kloes, A; Lefloch, F; Lemme, M; Snyder, JP; Weber, WM; Calvet, LE
    Resum:
    This paper explores how the Schottky barrier (SB) transistor is used in a variety of applications and material systems. A discussion of SB formation, current transport processes, and an overview of modeling are first considered. Three discussions follow, which detail the role of SB transistors in high performance, ubiquitous and cryogenic electronics. For high performance computing, the SB typically needs to be minimized to achieve optimal performance and we explore the methods adopted in carbon nanotube technology and two-dimensional electronics. On the contrary for ubiquitous electronics, the SB can be used advantageously in source-gated transistors and reconfigurable FETs for sensors, neuromorphic hardware and security applications. Similarly, judicious use of a SB can be an asset for applications involving Josephson junction FETs.Creative Commons Attribution license.
  • Altres:

    Enllaç font original: https://iopscience.iop.org/article/10.1088/1361-6528/acd05f
    Referència de l'ítem segons les normes APA: Schwarz, M; Vethaak, TD; Derycke, V; Francheteau, A; Iniguez, B; Kataria, S; Kloes, A; Lefloch, F; Lemme, M; Snyder, JP; Weber, WM; Calvet, LE (2023). The Schottky barrier transistor in emerging electronic devices. Nanotechnology, 34(35), 352002-. DOI: 10.1088/1361-6528/acd05f
    Referència a l'article segons font original: Nanotechnology. 34 (35): 352002-
    DOI de l'article: 10.1088/1361-6528/acd05f
    Any de publicació de la revista: 2023-08-27
    Entitat: Universitat Rovira i Virgili
    Versió de l'article dipositat: info:eu-repo/semantics/publishedVersion
    Data d'alta del registre: 2026-05-09
    Autor/s de la URV: Iñiguez Nicolau, Benjamin
    Departament: Enginyeria Electrònica, Elèctrica i Automàtica
    URL Document de llicència: https://repositori.urv.cat/ca/proteccio-de-dades/
    Tipus de publicació: Journal Publications
    Autor segons l'article: Schwarz, M; Vethaak, TD; Derycke, V; Francheteau, A; Iniguez, B; Kataria, S; Kloes, A; Lefloch, F; Lemme, M; Snyder, JP; Weber, WM; Calvet, LE
    Accès a la llicència d'ús: https://creativecommons.org/licenses/by/3.0/es/
    Àrees temàtiques: Physics, applied, Nanoscience and nanotechnology, Nanoscience & nanotechnology, Mechanics of materials, Mechanical engineering, Materials science, multidisciplinary, Materials science (miscellaneous), Materials science (all), Materials science, General medicine, General materials science, General chemistry, Engineering, multidisciplinary, Engineering, Engenharias ii, Electrical and electronic engineering, Ciências agrárias i, Chemistry (miscellaneous), Chemistry (all), Bioengineering, Astronomia / física
    Adreça de correu electrònic de l'autor: benjamin.iniguez@urv.cat, benjamin.iniguez@urv.cat
  • Paraules clau:

    Thin-film transistors
    Thin film transistors
    Source-gated transistors
    Schottky barriers
    Josephson junctions
    Field effect transistors
    2d materials
    1d materials
    transport-properties
    silicon-nanowire transistors
    field-effect transistors
    effective richardson constant
    contact resistance
    carbon-nanotube transistors
    andreev reflection
    2-dimensional materials
    Bioengineering
    Chemistry (Miscellaneous)
    Electrical and Electronic Engineering
    Engineering
    Multidisciplinary
    Materials Science
    Materials Science (Miscellaneous)
    Mechanical Engineering
    Mechanics of Materials
    Nanoscience & Nanotechnology
    Nanoscience and Nanotechnology
    Physics
    Applied
    Materials science (all)
    General medicine
    General materials science
    General chemistry
    Engenharias ii
    Ciências agrárias i
    Chemistry (all)
    Astronomia / física
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