Autor según el artículo: Lime, F; Iniguez, B; Kloes, A
Departamento: Enginyeria Electrònica, Elèctrica i Automàtica
Autor/es de la URV: Iñiguez Nicolau, Benjamin / Lime, François Gilbert Marie
Palabras clave: Soi Mosfets Fringing fields
Resumen: This paper presents a new conformal mapping method to solve 2D Laplace and Poisson equations in MOS devices. More specifically, it consists of an analytical solution of the 2D Laplace equation in a rectangular domain with Dirichlet boundary conditions, with arbitrary values on the boundaries. The advantages of the new method are that all four edges of the rectangle are taken into account and the solution consists of closed-form analytical expressions, which make it fast and suitable for compact modeling. The new model was validated against other similar methods. It was found that the new model is much faster, easier to implement, and avoids many numerical issues, especially near the boundaries, at the cost of a very small loss in accuracy.
Áreas temáticas: Química Physics, applied Physics and astronomy (miscellaneous) Physics and astronomy (all) Odontología Medicina iii Medicina ii Medicina i Materiais Matemática / probabilidade e estatística Interdisciplinar Geociências General physics and astronomy Farmacia Ensino Engenharias iv Engenharias iii Engenharias ii Engenharias i Condensed matter physics Ciências biológicas iii Ciências biológicas i Ciências ambientais Ciências agrárias i Ciência da computação Biotecnología Biodiversidade Atomic and molecular physics, and optics Astronomia / física Antropologia / arqueologia
Acceso a la licencia de uso: https://creativecommons.org/licenses/by/3.0/es/
Direcció de correo del autor: francois.lime@urv.cat benjamin.iniguez@urv.cat
Identificador del autor: 0000-0002-1024-6480 0000-0002-6504-7980
Fecha de alta del registro: 2024-08-03
Versión del articulo depositado: info:eu-repo/semantics/publishedVersion
Enlace a la fuente original: https://pubs.aip.org/aip/jap/article/135/4/044501/3061422/A-new-analytical-method-for-modeling-a-2D
URL Documento de licencia: https://repositori.urv.cat/ca/proteccio-de-dades/
Referencia al articulo segun fuente origial: Journal Of Applied Physics. 135 (4): 044501-
Referencia de l'ítem segons les normes APA: Lime, F; Iniguez, B; Kloes, A (2024). A new analytical method for modeling a 2D electrostatic potential in MOS devices, applicable to compact modeling. Journal Of Applied Physics, 135(4), 044501-. DOI: 10.1063/5.0188863
DOI del artículo: 10.1063/5.0188863
Entidad: Universitat Rovira i Virgili
Año de publicación de la revista: 2024
Tipo de publicación: Journal Publications
Repositori URV