Articles producció científicaEnginyeria Electrònica, Elèctrica i Automàtica

A new analytical method for modeling a 2D electrostatic potential in MOS devices, applicable to compact modeling

  • Datos identificativos

    Identificador:  imarina:9366237
    Autores:  Lime, F; Iniguez, B; Kloes, A
    Resumen:
    This paper presents a new conformal mapping method to solve 2D Laplace and Poisson equations in MOS devices. More specifically, it consists of an analytical solution of the 2D Laplace equation in a rectangular domain with Dirichlet boundary conditions, with arbitrary values on the boundaries. The advantages of the new method are that all four edges of the rectangle are taken into account and the solution consists of closed-form analytical expressions, which make it fast and suitable for compact modeling. The new model was validated against other similar methods. It was found that the new model is much faster, easier to implement, and avoids many numerical issues, especially near the boundaries, at the cost of a very small loss in accuracy.
  • Otros:

    Enlace a la fuente original: https://pubs.aip.org/aip/jap/article/135/4/044501/3061422/A-new-analytical-method-for-modeling-a-2D
    Referencia de l'ítem segons les normes APA: Lime, F; Iniguez, B; Kloes, A (2024). A new analytical method for modeling a 2D electrostatic potential in MOS devices, applicable to compact modeling. Journal Of Applied Physics, 135(4), 044501-. DOI: 10.1063/5.0188863
    Referencia al articulo segun fuente origial: Journal Of Applied Physics. 135 (4): 044501-
    DOI del artículo: 10.1063/5.0188863
    Año de publicación de la revista: 2024-01-28
    Entidad: Universitat Rovira i Virgili
    Versión del articulo depositado: info:eu-repo/semantics/publishedVersion
    Fecha de alta del registro: 2026-05-09
    Autor/es de la URV: Iñiguez Nicolau, Benjamin / Lime, François Gilbert Marie
    Departamento: Enginyeria Electrònica, Elèctrica i Automàtica
    URL Documento de licencia: https://repositori.urv.cat/ca/proteccio-de-dades/
    Tipo de publicación: Journal Publications
    Autor según el artículo: Lime, F; Iniguez, B; Kloes, A
    Acceso a la licencia de uso: https://creativecommons.org/licenses/by/3.0/es/
    Áreas temáticas: Physics, applied, Physics and astronomy (miscellaneous), Physics and astronomy (all), General physics and astronomy, Engenharias iii, Condensed matter physics, Ciências agrárias i, Atomic and molecular physics, and optics, Astronomia / física
    Direcció de correo del autor: francois.lime@urv.cat, francois.lime@urv.cat, benjamin.iniguez@urv.cat, benjamin.iniguez@urv.cat
  • Palabras clave:

    Soi
    Mosfets
    Fringing fields
    Atomic and Molecular Physics
    and Optics
    Condensed Matter Physics
    Physics and Astronomy (Miscellaneous)
    Physics
    Applied
    Physics and astronomy (all)
    General physics and astronomy
    Engenharias iii
    Ciências agrárias i
    Astronomia / física
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