Noise-Based Simulation Technique for Circuit-Variability Analysis

Identificador:  imarina:9139053

Handle: https://hdl.handle.net/20.500.11797/imarina9139053

Autors:  Nikolaou, Aristeidis; Leise, Jakob; Pruefer, Jakob; Zschieschang, Ute; Klauk, Hagen; Darbandy, Ghader; Iniguez, Benjamin; Kloes, Alexander

Resum:
CCBY An accurate and efficient noise-based simulation technique for predicting the impact of device-parameter variability on the DC statistical behavior of integrated circuits is presented. The proposed method is validated on a source follower, a diode-load inverter and a current mirror based on organic thin-film transistors. Taking advantage of the standard noise analysis of a circuit, after translating the statistical variation of the electrical parameters of the transistors into equivalent-noise circuit components, the proposed technique yields results identical to those obtained from a Monte Carlo simulation, but in a significantly shorter amount of time.