Author, as appears in the article.: Nikolaou A; Leise J; Pruefer J; Zschieschang U; Klauk H; Darbandy G; Iniguez B; Kloes A

Department: Enginyeria Electrònica, Elèctrica i Automàtica

e-ISSN: 1557-9646

URV's Author/s: Iñiguez Nicolau, Benjamin

Keywords: Verilog-a Variability Transistors Threshold voltage Thin-film transistors Thin-film transistor Thin film transistors Organic circuits. Organic circuits Noise Monte carlo methods Monte carlo analysis Model Logic gates Integrated circuit modeling Hardware design languages Compact modeling

Abstract: CCBY An accurate and efficient noise-based simulation technique for predicting the impact of device-parameter variability on the DC statistical behavior of integrated circuits is presented. The proposed method is validated on a source follower, a diode-load inverter and a current mirror based on organic thin-film transistors. Taking advantage of the standard noise analysis of a circuit, after translating the statistical variation of the electrical parameters of the transistors into equivalent-noise circuit components, the proposed technique yields results identical to those obtained from a Monte Carlo simulation, but in a significantly shorter amount of time.

Thematic Areas: Engineering, electrical & electronic Electronic, optical and magnetic materials Electrical and electronic engineering Biotechnology

licence for use: https://creativecommons.org/licenses/by/3.0/es/

ISSN: 0018-9383

Author's mail: benjamin.iniguez@urv.cat

Author identifier: 0000-0002-6504-7980

Record's date: 2023-02-19

Papper version: info:eu-repo/semantics/publishedVersion

Link to the original source: https://ieeexplore.ieee.org/document/9302569

Licence document URL: http://repositori.urv.cat/ca/proteccio-de-dades/

Papper original source: Ieee Journal Of The Electron Devices Society. 9 450-455

APA: Nikolaou A; Leise J; Pruefer J; Zschieschang U; Klauk H; Darbandy G; Iniguez B; Kloes A (2021). Noise-Based Simulation Technique for Circuit-Variability Analysis. Ieee Journal Of The Electron Devices Society, 9(), 450-455. DOI: 10.1109/JEDS.2020.3046301

Article's DOI: 10.1109/JEDS.2020.3046301

Entity: Universitat Rovira i Virgili

Journal publication year: 2021

Publication Type: Journal Publications