Articles producció científicaEnginyeria Electrònica, Elèctrica i Automàtica

Noise-Based Simulation Technique for Circuit-Variability Analysis

  • Identification data

    Identifier:  imarina:9139053
    Handle: https://hdl.handle.net/20.500.11797/imarina9139053
    Authors:  Nikolaou, Aristeidis; Leise, Jakob; Pruefer, Jakob; Zschieschang, Ute; Klauk, Hagen; Darbandy, Ghader; Iniguez, Benjamin; Kloes, Alexander
    Abstract:
    CCBY An accurate and efficient noise-based simulation technique for predicting the impact of device-parameter variability on the DC statistical behavior of integrated circuits is presented. The proposed method is validated on a source follower, a diode-load inverter and a current mirror based on organic thin-film transistors. Taking advantage of the standard noise analysis of a circuit, after translating the statistical variation of the electrical parameters of the transistors into equivalent-noise circuit components, the proposed technique yields results identical to those obtained from a Monte Carlo simulation, but in a significantly shorter amount of time.

  • Others:

    Link to the original source: https://ieeexplore.ieee.org/document/9302569
    APA: Nikolaou, Aristeidis; Leise, Jakob; Pruefer, Jakob; Zschieschang, Ute; Klauk, Hagen; Darbandy, Ghader; Iniguez, Benjamin; Kloes, Alexander (2021). Noise-Based Simulation Technique for Circuit-Variability Analysis. Ieee Journal Of The Electron Devices Society, 9(), 450-455. DOI: 10.1109/JEDS.2020.3046301
    Paper original source: Ieee Journal Of The Electron Devices Society. 9 450-455
    Article's DOI: 10.1109/JEDS.2020.3046301
    Journal publication year: 2021
    Entity: Universitat Rovira i Virgili
    Paper version: info:eu-repo/semantics/publishedVersion
    Record's date: 2025-02-19
    URV's Author/s: Iñiguez Nicolau, Benjamin
    Department: Enginyeria Electrònica, Elèctrica i Automàtica
    Licence document URL: https://repositori.urv.cat/ca/proteccio-de-dades/
    Publication Type: Journal Publications
    ISSN: 0018-9383
    Author, as appears in the article.: Nikolaou, Aristeidis; Leise, Jakob; Pruefer, Jakob; Zschieschang, Ute; Klauk, Hagen; Darbandy, Ghader; Iniguez, Benjamin; Kloes, Alexander
    licence for use: https://creativecommons.org/licenses/by/3.0/es/
    e-ISSN: 1557-9646
    Thematic Areas: Engineering, electrical & electronic, Electronic, optical and magnetic materials, Electrical and electronic engineering, Biotechnology
    Author's mail: benjamin.iniguez@urv.cat

  • Keywords:

    Verilog-a
    Variability
    Transistors
    Threshold voltage
    Thin-film transistors
    Thin-film transistor
    Thin film transistors
    Organic circuits.
    Organic circuits
    Noise
    Monte carlo methods
    Monte carlo analysis
    Model
    Logic gates
    Integrated circuit modeling
    Hardware design languages
    Compact modeling
    Biotechnology
    Electrical and Electronic Engineering
    Electronic
    Optical and Magnetic Materials
    Engineering
    Electrical & Electronic

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