Link to the original source: https://iopscience.iop.org/article/10.1088/1361-6641/ab0446
APA: Assili, Kawther; Selmi, Wafa; Alouani, Khaled; Vilanova, Xavier (2019). Computational study and characteristics of In2S3 thin films: Effects of substrate nature and deposition temperature. Semiconductor Science And Technology, 34(4), 045006-045006. DOI: 10.1088/1361-6641/ab0446
Paper original source: Semiconductor Science And Technology. 34 (4): 045006-045006
Article's DOI: 10.1088/1361-6641/ab0446
Journal publication year: 2019
Entity: Universitat Rovira i Virgili
Paper version: info:eu-repo/semantics/acceptedVersion
Record's date: 2025-02-18
URV's Author/s: Vilanova Salas, Javier
Department: Enginyeria Electrònica, Elèctrica i Automàtica
Licence document URL: https://repositori.urv.cat/ca/proteccio-de-dades/
Publication Type: Journal Publications
ISSN: 13616641
Author, as appears in the article.: Assili, Kawther; Selmi, Wafa; Alouani, Khaled; Vilanova, Xavier
licence for use: https://creativecommons.org/licenses/by/3.0/es/
Thematic Areas: Química, Physics, condensed matter, Materials science, multidisciplinary, Materials science, Materials chemistry, Materiais, Interdisciplinar, Engineering, electrical & electronic, Engenharias iv, Engenharias iii, Engenharias ii, Electronic, optical and magnetic materials, Electrical and electronic engineering, Condensed matter physics, Ciências agrárias i, Biotecnología, Astronomia / física
Author's mail: xavier.vilanova@urv.cat