Articles producció científicaEnginyeria Electrònica, Elèctrica i Automàtica

Device Physics, Modeling and Simulation of Organic Electrochemical Transistors

  • Identification data

    Identifier:  imarina:9441805
    Authors:  Koch, M; Tseng, H; Weissbach, A; Iniguez, B; Leo, K; Kloes, A; Kleemann, H; Darbandy, G
    Abstract:
    In this work, we investigate organic electrochemical transistors (OECTs) as a novel artificial electronic device for the realization of synaptic behavior, bioelectronics, and a variety of applications. A numerical method considering the Poisson-Boltzmann statistics is introduced to reproduce associated charge densities, electrostatics and switching properties of OECTs. We shed light on the working principle of OECTs by taking into account the ionic charge distribution in the electrolyte and incomplete ionization of the organic semiconductor describing the underlying electrochemical redox reaction. This enables analyzing the OECTs electrical performance as well as a simplified chemical properties via an electrical double layer, doping and de-doping of the OMIEC layer. We have fabricated, characterized, simulated and analyzed OECTs based on PEDOT:PSS, and we show that the proposed model reveals important properties of the device's working mechanism. The model shows a good agreement with the experimental data of the fabricated devices.
  • Others:

    Link to the original source: https://ieeexplore.ieee.org/document/10087327
    APA: Koch, M; Tseng, H; Weissbach, A; Iniguez, B; Leo, K; Kloes, A; Kleemann, H; Darbandy, G (2023). Device Physics, Modeling and Simulation of Organic Electrochemical Transistors. Ieee Journal Of The Electron Devices Society, 11(), 665-671. DOI: 10.1109/JEDS.2023.3263278
    Paper original source: Ieee Journal Of The Electron Devices Society. 11 665-671
    Article's DOI: 10.1109/JEDS.2023.3263278
    Journal publication year: 2023-01-01
    Entity: Universitat Rovira i Virgili
    Paper version: info:eu-repo/semantics/publishedVersion
    Record's date: 2026-05-09
    URV's Author/s: Iñiguez Nicolau, Benjamin
    Department: Enginyeria Electrònica, Elèctrica i Automàtica
    Licence document URL: https://repositori.urv.cat/ca/proteccio-de-dades/
    Publication Type: Journal Publications
    Author, as appears in the article.: Koch, M; Tseng, H; Weissbach, A; Iniguez, B; Leo, K; Kloes, A; Kleemann, H; Darbandy, G
    licence for use: https://creativecommons.org/licenses/by/3.0/es/
    Thematic Areas: Engineering, electrical & electronic, Electronic, optical and magnetic materials, Electrical and electronic engineering, Ciências agrárias i, Biotechnology
    Author's mail: benjamin.iniguez@urv.cat, benjamin.iniguez@urv.cat
  • Keywords:

    Synaptic devices
    Simulation
    Simulatio
    Semiconductor process modeling
    Semiconductor device measurement
    Oects
    Modeling
    Mathematical models
    Logic gates
    Ionization
    Electrolytes
    Electrical double layer
    Capacitance
    Biotechnology
    Electrical and Electronic Engineering
    Electronic
    Optical and Magnetic Materials
    Engineering
    Electrical & Electronic
    Ciências agrárias i
  • Documents:

  • Cerca a google

    Search to google scholar