Articles producció científicaEnginyeria Electrònica, Elèctrica i Automàtica

Device Physics, Modeling and Simulation of Organic Electrochemical Transistors

  • Datos identificativos

    Identificador:  imarina:9441805
    Autores:  Koch, M; Tseng, H; Weissbach, A; Iniguez, B; Leo, K; Kloes, A; Kleemann, H; Darbandy, G
    Resumen:
    In this work, we investigate organic electrochemical transistors (OECTs) as a novel artificial electronic device for the realization of synaptic behavior, bioelectronics, and a variety of applications. A numerical method considering the Poisson-Boltzmann statistics is introduced to reproduce associated charge densities, electrostatics and switching properties of OECTs. We shed light on the working principle of OECTs by taking into account the ionic charge distribution in the electrolyte and incomplete ionization of the organic semiconductor describing the underlying electrochemical redox reaction. This enables analyzing the OECTs electrical performance as well as a simplified chemical properties via an electrical double layer, doping and de-doping of the OMIEC layer. We have fabricated, characterized, simulated and analyzed OECTs based on PEDOT:PSS, and we show that the proposed model reveals important properties of the device's working mechanism. The model shows a good agreement with the experimental data of the fabricated devices.
  • Otros:

    Enlace a la fuente original: https://ieeexplore.ieee.org/document/10087327
    Referencia de l'ítem segons les normes APA: Koch, M; Tseng, H; Weissbach, A; Iniguez, B; Leo, K; Kloes, A; Kleemann, H; Darbandy, G (2023). Device Physics, Modeling and Simulation of Organic Electrochemical Transistors. Ieee Journal Of The Electron Devices Society, 11(), 665-671. DOI: 10.1109/JEDS.2023.3263278
    Referencia al articulo segun fuente origial: Ieee Journal Of The Electron Devices Society. 11 665-671
    DOI del artículo: 10.1109/JEDS.2023.3263278
    Año de publicación de la revista: 2023-01-01
    Entidad: Universitat Rovira i Virgili
    Versión del articulo depositado: info:eu-repo/semantics/publishedVersion
    Fecha de alta del registro: 2026-05-09
    Autor/es de la URV: Iñiguez Nicolau, Benjamin
    Departamento: Enginyeria Electrònica, Elèctrica i Automàtica
    URL Documento de licencia: https://repositori.urv.cat/ca/proteccio-de-dades/
    Tipo de publicación: Journal Publications
    Autor según el artículo: Koch, M; Tseng, H; Weissbach, A; Iniguez, B; Leo, K; Kloes, A; Kleemann, H; Darbandy, G
    Acceso a la licencia de uso: https://creativecommons.org/licenses/by/3.0/es/
    Áreas temáticas: Engineering, electrical & electronic, Electronic, optical and magnetic materials, Electrical and electronic engineering, Ciências agrárias i, Biotechnology
    Direcció de correo del autor: benjamin.iniguez@urv.cat, benjamin.iniguez@urv.cat
  • Palabras clave:

    Synaptic devices
    Simulation
    Simulatio
    Semiconductor process modeling
    Semiconductor device measurement
    Oects
    Modeling
    Mathematical models
    Logic gates
    Ionization
    Electrolytes
    Electrical double layer
    Capacitance
    Biotechnology
    Electrical and Electronic Engineering
    Electronic
    Optical and Magnetic Materials
    Engineering
    Electrical & Electronic
    Ciências agrárias i
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