Autor según el artículo: Hernandez-Barrios Y; Gaspar-Angeles JN; Estrada M; Iniguez B; Cerdeira A
Departamento: Enginyeria Electrònica, Elèctrica i Automàtica
e-ISSN: 1557-9646
Autor/es de la URV: Iñiguez Nicolau, Benjamin
Palabras clave: Voltage measurement Verilog-a Transistors Thin film transistors Semiconductor device modeling Mobility Inverters Integrated circuit modeling Dynamic model Circuit simulator Capacitances model. Capacitances model Capacitance
Resumen: CCBY The Analytical Full Capacitance Model (AFCM) for amorphous oxide semiconductors thin film transistors (AOSTFTs) is first validated, using a 19-stages Ring Oscillator (RO) fabricated and measured. The model was described in Verilog-A language to use it in a circuit simulator in this case SmartSpice from Silvaco. The model includes the extrinsic effects related to specific overlap capacitances present in bottom-gate AOSTFT structures. The dynamic behavior of the simulated circuit, when the TFT internal capacitances are increased or decreased and for different supply voltages of 10, 15 and 20 V, is compared with measured characteristics, obtaining a very good agreement. Afterwards, the AFCM is used to simulate the dynamic behavior of a pixel control circuit for a light emitting diode active matrix display (AMOLED), using an AOSTFT.
Áreas temáticas: Engineering, electrical & electronic Electronic, optical and magnetic materials Electrical and electronic engineering Biotechnology
Acceso a la licencia de uso: https://creativecommons.org/licenses/by/3.0/es/
ISSN: 0018-9383
Direcció de correo del autor: benjamin.iniguez@urv.cat
Identificador del autor: 0000-0002-6504-7980
Fecha de alta del registro: 2024-07-27
Versión del articulo depositado: info:eu-repo/semantics/publishedVersion
URL Documento de licencia: https://repositori.urv.cat/ca/proteccio-de-dades/
Referencia al articulo segun fuente origial: Ieee Journal Of The Electron Devices Society. 9 464-468
Referencia de l'ítem segons les normes APA: Hernandez-Barrios Y; Gaspar-Angeles JN; Estrada M; Iniguez B; Cerdeira A (2021). Dynamic simulation of a-IGZO TFT circuits using the Analytical Full Capacitance Model (AFCM). Ieee Journal Of The Electron Devices Society, 9(), 464-468. DOI: 10.1109/JEDS.2020.3045347
Entidad: Universitat Rovira i Virgili
Año de publicación de la revista: 2021
Tipo de publicación: Journal Publications